发明名称 Contact pad structure for flip chip semiconductor die
摘要 A flip chip Schottky die is provided, which includes three contact bumps extending from a top surface of the die for electrically connecting with a board, a first and second bump being cathode contacts, and a third bump being an anode contact and having a larger surface than each of the first and second bumps for a 0.5 ampere device. Each bump is substantially rectangular at its base, but may have a curved or arched top surface on a square die. Also, provided is a contact bump useful in a flip chip device, such as a MOSFET or diode for a current of 1.0 amperes that includes a solder body of PbSn or a solder body free of lead comprising SnAgCu. Such a contact bump is substantially rectangular, and a height of approximately 120 μm.
申请公布号 US7821133(B2) 申请公布日期 2010.10.26
申请号 US20060586902 申请日期 2006.10.26
申请人 INTERNATIONAL RECTIFIER CORPORATION 发明人 SCHOFIELD HAZEL D.;SKOCKI SLAWOMIR;ADAMSON PHILIP
分类号 H01L21/461;H01L29/12 主分类号 H01L21/461
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