发明名称 Method for forming line pattern array, photomask having the same and semiconductor device fabricated thereby
摘要 A method of forming a line pattern array comprises the steps of setting a layout which includes first continuous line patterns arranged to have a first line width and a second continuous line pattern arranged to have a second line width larger than the first line width and positioned outside the first continuous line patterns; transferring the layout on a wafer; and inducing light scattering by changing an outermost pattern of the first continuous line patterns, which is most closely adjacent to the second continuous line patterns, into a plurality of dotted line patterns, wherein the plurality of the dotted patterns are arranged in a line form in order that a line pattern, which is different from the first continuous line patterns in line width, is formed based on a size of the dotted patterns.
申请公布号 US7820344(B2) 申请公布日期 2010.10.26
申请号 US20070957019 申请日期 2007.12.14
申请人 HYNIX SEMICONDUCTOR INC. 发明人 MOON JAE IN
分类号 G03F1/00;G03F7/00;G06F17/50 主分类号 G03F1/00
代理机构 代理人
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