| 摘要 |
An electrical connecting apparatus comprises a housing having a first recess extending in a first direction in a horizontal plane, opened downward, and having at least a backside inward surface and a plurality of slits spaced in the first direction and extending in a second direction intersecting the first direction in the horizontal plane, a plurality of contacts each arranged in the housing in a state of extending inside the slit from within the first recess and electrically connecting a conductive portion provided on a board to an electrode of a device under test, and a probe holder arranged in the first recess. The backside inward surface of the first recess includes an inclined portion inclined to both the horizontal plane and a vertical plane vertical to it in a state of being further to the front side towards the upper side, and each contact abuts on the inclined portion at least at part of the back end. Thus, slip of the contact against the conductive portion is reduced.
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