发明名称 METHOD, APPARATUS AND PROGRAM FOR DETERMINING OVERLAP
摘要 <p><P>PROBLEM TO BE SOLVED: To improve the efficiency of checking overlap of a plurality of patterns disposed on data. <P>SOLUTION: A negative pattern 13 including a region excluding a region occupied by a first pattern out of two patterns which are targets of determining the existence of overlap is generated from the entire region of a printed board 10, an OR pattern 14 including both of the region occupied by the negative pattern 13 and a region occupied by the second pattern out of the two patterns is generated, and coincidence or non-coincidence between the area of the negative pattern 13 and the area of the OR pattern 14 is determined. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2010238023(A) 申请公布日期 2010.10.21
申请号 JP20090086209 申请日期 2009.03.31
申请人 FUJITSU LTD 发明人 ARATA AKIRA;AKAGI HIROKAZU;AKENAGA MICHIKO
分类号 G06F17/50;G06T7/60 主分类号 G06F17/50
代理机构 代理人
主权项
地址