发明名称 P-TYPE SEMICONDUCTOR DEVICES
摘要 <p>A semiconductor device comprises an active layer (31) above a first confinement layer (32). The active layer (31) comprises a layer of a-Sn less than 20nm thick. The first confinement layer (32) is formed of material with a wider band gap than a-Sn, wherein the band gap offset between a-Sn and this material allows confinement of charge carriers in the active layer so that the active layer acts as a quantum well. A similar second confinement layer (34) may be formed over the active layer (31). The semiconductor device may be a p-FET. A method of fabricating such a semiconductor device is also described.</p>
申请公布号 WO2010119244(A1) 申请公布日期 2010.10.21
申请号 WO2010GB00742 申请日期 2010.04.12
申请人 QINETIQ LIMITED;WALLIS, DAVID, JOHN 发明人 WALLIS, DAVID, JOHN
分类号 H01L29/16;H01L29/267;H01L29/778 主分类号 H01L29/16
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