发明名称 |
P-TYPE SEMICONDUCTOR DEVICES |
摘要 |
<p>A semiconductor device comprises an active layer (31) above a first confinement layer (32). The active layer (31) comprises a layer of a-Sn less than 20nm thick. The first confinement layer (32) is formed of material with a wider band gap than a-Sn, wherein the band gap offset between a-Sn and this material allows confinement of charge carriers in the active layer so that the active layer acts as a quantum well. A similar second confinement layer (34) may be formed over the active layer (31). The semiconductor device may be a p-FET. A method of fabricating such a semiconductor device is also described.</p> |
申请公布号 |
WO2010119244(A1) |
申请公布日期 |
2010.10.21 |
申请号 |
WO2010GB00742 |
申请日期 |
2010.04.12 |
申请人 |
QINETIQ LIMITED;WALLIS, DAVID, JOHN |
发明人 |
WALLIS, DAVID, JOHN |
分类号 |
H01L29/16;H01L29/267;H01L29/778 |
主分类号 |
H01L29/16 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|