SEMICONDUCTOR DEVICE AND METHOD FOR TESTING SAME

摘要

The conventional semiconductor devices have a drawback that the precisions of chip level tests cannot be improved. A semiconductor device of the present invention comprises: a transmission circuit (Tx) that generates a transfer signal obtained by modulating a transfer data with a carrier including a higher frequency component than the symbol rate of the transfer data or the Nyquist frequency; a reception circuit (Rx) that demodulates the transfer signal to reproduce the transfer data; an AC coupling element (CPL) that AC transfers the transfer signal from the transmission circuit (Tx) to the reception circuit (Rx); and a test path including a matching circuit (30) that provides a pseudo reproduction of the transfer characteristic of the AC coupling element (CPL). The test path modulates a test input data with a carrier to generate a test transfer signal; uses the matching circuit (30) to transfer the test transfer signal; and demodulates the transferred test transfer signal to output a test output data.