| 摘要 |
PROBLEM TO BE SOLVED: To distribute data in consideration of the total system failure occurrence risk including not only a deterioration failure of a memory cell but also a fatigue crack in a joint location made of solder or the like or in an interconnection. SOLUTION: The storage device includes: a table that represents a failure occurrence probability of a failure occurrence portion address in a data storage area; a first module 12 for calculating the failure occurrence risk index for each data storage area address; and a second module 10 for generating a distribution table for distributing data to addresses so that a power saving index of each data storage area address, and an access speed index required for accessing each data storage area address per a unit data volume satisfy a constraint condition and the failure occurrence risk index is minimized, and for distributing data to addresses according to the distribution table. COPYRIGHT: (C)2011,JPO&INPIT
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