发明名称 |
METHOD FOR PRODUCING SILICON EPITAXIAL WAFER |
摘要 |
<p>Disclosed is a method for producing a silicon epitaxial wafer, which comprises: a growth step F in which an epitaxial layer is grown on a silicon single crystal substrate; a first polishing step D in which at least the surface of the silicon single crystal substrate is polished without using abrasive grains before the growth step; and a second polishing step G in which at least the surface of the silicon single crystal substrate is subjected to finish polishing after the growth step.</p> |
申请公布号 |
WO2010119833(A1) |
申请公布日期 |
2010.10.21 |
申请号 |
WO2010JP56517 |
申请日期 |
2010.04.12 |
申请人 |
SUMCO CORPORATION;OKUUCHI, SHIGERU;OGATA, SHINICHI |
发明人 |
OKUUCHI, SHIGERU;OGATA, SHINICHI |
分类号 |
H01L21/304;B24B37/04;C23C16/02;C23C16/24;C23C16/56;C30B25/20;H01L21/205 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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