| 摘要 |
A test pattern generation apparatus includes an activation rate setting unit configured to set an activation rate of a cell, a test pattern generator configured to generate a test pattern based on the activation rate set by the activation rate setting unit, a supply voltage calculator configured to calculate a supply voltage of a semiconductor integrated circuit using the test pattern generated by the test pattern generator, and an output unit configured to output the test pattern generated by the test pattern generator when the supply voltage calculated by the supply voltage calculator fulfills the target supply voltage.
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