| 摘要 |
A semiconductor test equipment and a timing measuring method for use in the semiconductor test equipment are provided, that can perform simultaneous measurement of timings of defined times between edges in cycles even in a case where a capacity is large as in a test pattern for the semiconductor test equipment or a case where the cycles are away from each other. In order to achieve this, the semiconductor test equipment includes: a data shifting flip-flip for shifting input data with a reference clock of the semiconductor test equipment by a period of one clock, provided in a secondary logical comparison circuit 71 ; the first logical comparison and selection circuit 71 a for determining whether timings of the first defined time Ta that is a period between two pre-selected edges are good or not, and outputting a determination result; and the second logical comparison and selection circuit 71 b for determining whether timings of the second defined time Tb that is a period between two pre-selected edges are good or not, and outputting a determination result. |
