发明名称 Semi-generic in-circuit test fixture
摘要 A semi-generic test fixture for testing printed circuit boards (PCBs) and/or for testing printed circuit boards assemblies (PCBAs) is presented. The semi-generic test fixture implements a combination of generic and customized parts for tester-to-fixture interface instead of a static dedicated in-circuit test (ICT) fixture which is able to interconnect only one kind of unit under test (UUT) to an ICT tester test-head. The semi-generic ICT fixture (SGICTF) is able to interconnect an ICT test-head with a variety of UUT types with a minimum of adaptation. Accordingly, the SGICTF generally comprises two generic PCB connected to the tester and two customized PCB connected to the generic PCB and adapted to interface the particular UUT via testing probes.
申请公布号 US7816933(B2) 申请公布日期 2010.10.19
申请号 US20080168397 申请日期 2008.07.07
申请人 BLOUIN MARTIN 发明人 BLOUIN MARTIN
分类号 G01R31/02 主分类号 G01R31/02
代理机构 代理人
主权项
地址