发明名称 Method of forming semiconductor devices in which a cell gate pattern and a resistor pattern are formed of a same material
摘要 A semiconductor device is formed by providing a semiconductor substrate comprising a cell region, a peripheral circuit region, and a resistor region, forming a device isolation layer on the semiconductor substrate so as to define an active region, forming a first insulating layer and a polysilicon pattern on the active region of the peripheral circuit region, forming a second insulating layer, a charge storage layer, and a third insulating layer on the active region of the cell region, forming a conductive layer on the semiconductor substrate, and patterning the conductive layer to form conductive patterns on the third insulating layer of the cell region, the polysilicon pattern of the active region of peripheral circuit region, and the semiconductor substrate of the resistor region, respectively.
申请公布号 US7816245(B2) 申请公布日期 2010.10.19
申请号 US20070648992 申请日期 2007.01.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SEL JONG-SUN;CHOI JUNG-DAL
分类号 H01L21/3205 主分类号 H01L21/3205
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