发明名称 Process of fabricating microelectronic structures
摘要 The present invention is directed toward methods of fabricating components for microelectronic devices, microelectronic devices including memory cells or other components, and computers including memory devices. One embodiment is directed toward a method of fabricating a memory cell on a workpiece having a substrate, a plurality of active areas in the substrate, and a dielectric layer over the active areas. The method includes constructing bit line contact openings in the dielectric layer over first portions of the active areas and cell plug openings over second portions of the active areas. The method also includes depositing a first conductive material into the bit line contact openings to form bit line contacts and, into the cell plug openings to form cell plugs. Then, a trench is formed through an upper portion of a plurality of the bit line contacts and portions of the dielectric layer between bit line contacts.
申请公布号 US7814650(B2) 申请公布日期 2010.10.19
申请号 US20060542706 申请日期 2006.10.03
申请人 MICRON TECHNOLOGY, INC. 发明人 TANG SANH DANG
分类号 H05K3/10;G11C7/00;H01L21/4763;H01L21/8239;H01L21/8242;H05K3/40 主分类号 H05K3/10
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