发明名称 High frequency circuit analyser
摘要 An analyzer for measuring the response of an electronic device (DUT 206) to an RF input signal from a signal generator (240a) is described. An active load pull circuit (201) is connected to the DUT 206, which receives an output signal from the DUT 206 and then feeds a modified signal back to the DUT 206. The signal is modified by a signal processing circuit (237) in view of input signals x, y to control the magnitude gain and phase change effected by the feedback circuit (237). Thus, positive feedback loops are avoided and better control of the analyzer is permitted. A network analyzer, or other signal measuring device (242), logs the waveforms (from which s-parameters derived) observed at ports of the DUT 206, thereby allowing the behavior of the DUT 206 under various load conditions to be analyzed.
申请公布号 US7816926(B2) 申请公布日期 2010.10.19
申请号 US20040565519 申请日期 2004.07.23
申请人 MESURO LIMITED 发明人 BENEDIKT JOHANNES;TASKER PAUL JUAN
分类号 G01R27/04;G01R27/28;G01R27/32;G01R31/28 主分类号 G01R27/04
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