INTEGRATED CIRCUIT MODELING BASED ON EMPIRICAL TEST DATA CROSS-REFERENCE TO RELATED APPLICATIONS

摘要

PURPOSE: An integrated circuit modeling based on empirical test data cross-reference to related applications is provided to execute IC modeling by data processing system. CONSTITUTION: Empirical measured values are received from an IC(Integrated Circuit) containing transistors with plural terminals(202). Mathematical simulation model of a simulated transistor is received(204). The intermediate data set decides the terminal current/electric charge set simulated about the other terminal voltage set based on the simulation model(206). The time domain simulation model of the transistor is obtained by processing the intermediate data set about the measured values(208).