发明名称 |
Method for blocking unknown values in output response of scan test patterns for testing circuits |
摘要 |
A method includes compressing control patterns describing values required at the control signals of blocking logic gates, by linear feedback shift register LFSR reseeding; bypassing blocking logic gates for some groups of scan chains that do not capture unknown values in output response of scan test patterns for testing circuits; and reducing numbers of specified bits in densely specified ones of the control patterns for further reducing the size of a seed of the LFSR.
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申请公布号 |
US7818643(B2) |
申请公布日期 |
2010.10.19 |
申请号 |
US20080034088 |
申请日期 |
2008.02.20 |
申请人 |
NEC LABORATORIES AMERICA, INC. |
发明人 |
WANG SEONGMOON;CHAKRADHAR SRIMAT T |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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