发明名称 Method of forming non-volatile memory having charge trap layer with compositional gradient
摘要 A flash memory device and method of forming a flash memory device are provided. The flash memory device includes a silicon nitride layer having a compositional gradient in which the ratio of silicon to nitrogen varies through the thickness of the layer. The silicon nitride layer having a compositional gradient of silicon and nitrogen provides an increase in charge holding capacity and charge retention time of the unit cell of a non-volatile memory device.
申请公布号 US7816205(B2) 申请公布日期 2010.10.19
申请号 US20080256119 申请日期 2008.10.22
申请人 APPLIED MATERIALS, INC. 发明人 BALSEANU MIHAELA;ZUBKOV VLADIMIR;XIA LI-QUN;NOORI ATIF;ARGHAVANI REZA;WITTY DEREK R.;AL-BAYATI AMIR
分类号 H01L21/336;H01L21/31;H01L27/088;H01L27/105 主分类号 H01L21/336
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