发明名称 SEMICONDUCTOR DEVICE WITH RECESS GATE AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>PURPOSE: A semiconductor device with recess gate and a method for manufacturing the same are provided to prevent refresh deterioration due to GID(Gate Induced Drain Leakage) by improving the quality of a gate insulating layer through a plasma process. CONSTITUTION: A substrate(31) equipped with a recess pattern(34) is prepared. A gate electrode covers the recess pattern. A threshold voltage control layer(35) is formed on the recess pattern. A source and drain region are formed on both sides of the gate electrode. A gate insulating layer(36) is interposed between the gate electrode and the substrate.</p>
申请公布号 KR20100112415(A) 申请公布日期 2010.10.19
申请号 KR20090030918 申请日期 2009.04.09
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, SEUNG MI;JI, YUN HYUCK;KIM, TAE KYUN;LEE, JIN YUL
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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