发明名称 |
SEMICONDUCTOR DEVICE WITH RECESS GATE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
<p>PURPOSE: A semiconductor device with recess gate and a method for manufacturing the same are provided to prevent refresh deterioration due to GID(Gate Induced Drain Leakage) by improving the quality of a gate insulating layer through a plasma process. CONSTITUTION: A substrate(31) equipped with a recess pattern(34) is prepared. A gate electrode covers the recess pattern. A threshold voltage control layer(35) is formed on the recess pattern. A source and drain region are formed on both sides of the gate electrode. A gate insulating layer(36) is interposed between the gate electrode and the substrate.</p> |
申请公布号 |
KR20100112415(A) |
申请公布日期 |
2010.10.19 |
申请号 |
KR20090030918 |
申请日期 |
2009.04.09 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, SEUNG MI;JI, YUN HYUCK;KIM, TAE KYUN;LEE, JIN YUL |
分类号 |
H01L21/336;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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