发明名称 FREQUENCY CHARACTERISTICS MEASURING DEVICE
摘要 It is possible to provide a frequency characteristics measuring device which can simplify the configuration for performing a measurement and reduce the undue effort required for the measurement. A spectrum analyzer (10) includes: two sets of measuring units having mixers (110, 210), local oscillators (112, 212), and IF sections (120, 220) for separately measuring frequency characteristics of two input signals; a trigger generation section (310) which generates a trigger signal for specifying a measurement start timing in each of the two sets of measuring units; a sweep control section (300) which simultaneously sends an instruction to the two local oscillators (112, 212) when a trigger signal is inputted and performs a sweep control so that the two local oscillators (112, 212) output local oscillation signals of the same frequency at the same timing.
申请公布号 US2010259245(A1) 申请公布日期 2010.10.14
申请号 US20080745685 申请日期 2008.12.15
申请人 ADVANTEST CORPORATION 发明人 KUNIE SHINJI;AOYAMA SATORU;OGINO YOSHIMASA
分类号 G01R23/16;G01R23/02 主分类号 G01R23/16
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