发明名称 INSPECTION CIRCUIT AND ELECTRONIC CIRCUIT
摘要 <P>PROBLEM TO BE SOLVED: To provide an inspection circuit and an electronic circuit capable of reducing cost by reducing the number of input terminals for inspection, and improving reliability. <P>SOLUTION: A first wire L1 for electrically connecting a first input terminal a1 to a first Y driver 110 is provided therebetween, and a second wire L2 for electrically connecting a second input terminal b1 to a second Y driver 120 is provided therebetween. A selection circuit 210 electrically separates the first wire L1 from the second wire L2 and an inspection terminal T1 during a normal time, and electrically connects the first wire L1 and the second wire L2 to the inspection terminal T1 during an inspection time. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010230526(A) 申请公布日期 2010.10.14
申请号 JP20090078891 申请日期 2009.03.27
申请人 SEIKO EPSON CORP 发明人 OTA HITOSHI
分类号 G01R31/28;G09F9/00;G09F9/30;G09G3/20;G09G3/30;H01L51/50;H05B33/12 主分类号 G01R31/28
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