发明名称 |
TEST PIECE, METHOD OF MANUFACTURING THE SAME, AND MEASUREMENT METHOD USING THE TEST PIECE |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a test piece capable of more effectively performing analysis with good measurement sensitivity, to provide a method of manufacturing the test piece, and to provide a measurement method using the test piece. <P>SOLUTION: The method of manufacturing the test piece includes: a first step for obtaining a test piece including a nanostructure surface; a second step for dividing into a specific region and a peripheral region for surrounding the specific region to the surface of the test piece having the nanostructure surface obtained in the first step; and a third step for performing lyophilic treatment to the specific region or lyophobic treatment to the peripheral region such that the specific region divided by the second step has a relatively smaller contact angle than the peripheral region. Thus, the test piece is obtained which has improved measurement sensitivity and can be analyzed effectively. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
申请公布号 |
JP2010230352(A) |
申请公布日期 |
2010.10.14 |
申请号 |
JP20090075662 |
申请日期 |
2009.03.26 |
申请人 |
NIDEK CO LTD;FUKUOKA TAKAO |
发明人 |
OKA SHIGEKI;NAKANISHI HIROSHI;FUKUOKA TAKAO |
分类号 |
G01N21/65;B82Y15/00;G01N21/27;G01N21/35;G01N21/3577;G01N21/41;G01N21/64 |
主分类号 |
G01N21/65 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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