发明名称 TEST PIECE, METHOD OF MANUFACTURING THE SAME, AND MEASUREMENT METHOD USING THE TEST PIECE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a test piece capable of more effectively performing analysis with good measurement sensitivity, to provide a method of manufacturing the test piece, and to provide a measurement method using the test piece. <P>SOLUTION: The method of manufacturing the test piece includes: a first step for obtaining a test piece including a nanostructure surface; a second step for dividing into a specific region and a peripheral region for surrounding the specific region to the surface of the test piece having the nanostructure surface obtained in the first step; and a third step for performing lyophilic treatment to the specific region or lyophobic treatment to the peripheral region such that the specific region divided by the second step has a relatively smaller contact angle than the peripheral region. Thus, the test piece is obtained which has improved measurement sensitivity and can be analyzed effectively. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2010230352(A) 申请公布日期 2010.10.14
申请号 JP20090075662 申请日期 2009.03.26
申请人 NIDEK CO LTD;FUKUOKA TAKAO 发明人 OKA SHIGEKI;NAKANISHI HIROSHI;FUKUOKA TAKAO
分类号 G01N21/65;B82Y15/00;G01N21/27;G01N21/35;G01N21/3577;G01N21/41;G01N21/64 主分类号 G01N21/65
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