发明名称 Delay Parameter Testing for Multiple-Device Master-slave Configuration Using a Single-Device Testing System
摘要 Devices to be arranged in a master-slave configuration are individually tested using a testing system that ensures that the devices will satisfy an interconnection requirement of that configuration. The testing system configures a first device into one of a master mode of operation and a slave mode of operation, and adjusts frame starting positions of respective traffic flows associated with the configured mode until measured delay parameters of that mode substantially match corresponding ones of a selected set of prospective delay parameters. If the traffic flows of the one configured mode as adjusted are substantially error free, the first device is configured into the other mode, and frame starting positions of respective traffic flows associated with the other configured mode of the first device are adjusted until measured delay parameters of that mode substantially match corresponding ones of the selected set of prospective delay parameters. If the traffic flows of the other configured mode as adjusted are substantially error free, the first device is identified as satisfying the interconnection requirement.
申请公布号 US2010262671(A1) 申请公布日期 2010.10.14
申请号 US20090423276 申请日期 2009.04.14
申请人 CHEN SI RUO;LIU JIN SONG;WANG TAO 发明人 CHEN SI RUO;LIU JIN SONG;WANG TAO
分类号 G06F15/16;G06F11/28 主分类号 G06F15/16
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