发明名称 WAFER HOLDER FOR WAFER PROBER, AND WAFER PROBER MOUNTED WITH THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a wafer holder for a wafer prober that allows positional precision and temperature uniformity to be increased, and also allows the chip to be heated and cooled rapidly, and to provide a wafer prober device mounted with the same. SOLUTION: This wafer holder 1 for a wafer prober: includes a chuck top 2 having a chuck top conductor layer 3 on a surface thereof, and a support 4 for supporting the chuck top 2; and has a cavity in a portion between the chuck top 2 and the support 4. The chuck top 2 preferably includes a heating body 6. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010232665(A) 申请公布日期 2010.10.14
申请号 JP20100094711 申请日期 2010.04.16
申请人 SUMITOMO ELECTRIC IND LTD 发明人 NATSUHARA MASUHIRO;ITAKURA KATSUHIRO;NAKADA HIROHIKO
分类号 H01L21/66;H01L21/683 主分类号 H01L21/66
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