| 摘要 |
PROBLEM TO BE SOLVED: To provide a technology for removing an effect of uncertainty of a wavelength in a light source used for measurement, concerning a technology for measuring a refractive index by using an interferometer. SOLUTION: A prism 1 to be measured arranged in interferometers 9, 31 is moved in a specific direction, to thereby change an optical path length of first light emitted from the light source 3 and passing the prism 1 to be measured, and an optical path length of second light emitted from the same light source 3 and reflected by the prism 1 to be measured, respectively. Then, each change is measured, and the refractive index of the prism 1 to be measured is calculated based on a relationship between the measured change of the optical path length of the first light and the measured change of the optical path length of the second light. COPYRIGHT: (C)2011,JPO&INPIT
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