发明名称 Semiconductor Wafer and Method of Manufacturing the Same and Method of Manufacturing Semiconductor Device
摘要 A semiconductor wafer comprising: a tubular trench formed at a position to form a through-hole electrode of a wafer; an insulating member buried inside the trench and on an upper surface of the trench; a gate electrode film and a metal film formed on an upper surface of the insulating member; a multilevel columnar wiring via formed on an upper surface of the metal film; and an external connection electrode formed electrically connected to the metal film via the multilevel columnar wiring via. In this manner, it is unnecessary to have a new process of dry etching to form a through-hole electrode after thinning the wafer and equipment development. Moreover, introduction of a specific design enables formation of through-hole electrodes with significantly reduced difficulties of respective processes.
申请公布号 US2010258948(A1) 申请公布日期 2010.10.14
申请号 US20100823913 申请日期 2010.06.25
申请人 RENESAS TECHNOLOGY CORP. 发明人 TANAKA NAOTAKA;KANEMITSU KENJI;KIKUCHI TAKAFUMI;AKAZAWA TAKASHI
分类号 H01L23/538;H01L21/60;H01L21/768 主分类号 H01L23/538
代理机构 代理人
主权项
地址