发明名称 DEVICE FOR THE NON-DESTRUCTIVE TESTING OF AN ELECTRICALLY CONDUCTIVE STRUCTURE
摘要 The invention relates to a device for the non-destructive testing of an electrically conductive part comprising: - an induction portion, and - a receiving portion, - treatment means, in which the induction portion comprises an inductor dissociated into n layers (33) supplied at different frequencies f1, f2,..., fn, in which the receiving portion comprises several magnetic receivers (34) supplied at frequencies f1', f2',..., fn' connected to one another in at least one column, each magnetic receiver (34) being positioned under a layer, the indices n and m being integers = 2, and in which the treatment means make it possible to know the magnetic field in each of the magnetic receivers (34) of a column.
申请公布号 WO2010115963(A1) 申请公布日期 2010.10.14
申请号 WO2010EP54656 申请日期 2010.04.08
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIESALTERNATIVES;DECITRE, JEAN-MARC 发明人 DECITRE, JEAN-MARC
分类号 G01N27/90 主分类号 G01N27/90
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