发明名称 SPECIMEN WORKING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an FIB working device capable of optimizing the working order of working positions scattered on a specimen to be worked. SOLUTION: By having FIB-working requiring a plurality of processes carried out by appropriately rearranging the working order, shortening of a stage moving distance, reduction in the number of times of stage rotation and the reduction in the number of times of mechanism switching, in order to select kinds of working are attained and the total working time is shortened and working accuracy is improved. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010232185(A) 申请公布日期 2010.10.14
申请号 JP20100127672 申请日期 2010.06.03
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 KAMITSUMA TOSHIAKI;YOSHIZAWA YUKIO;AIZAWA MEGUMI;MARUYAMA HIDEKI
分类号 H01J37/317;B23K15/00;B23K15/02 主分类号 H01J37/317
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