发明名称 Methods, Photomasks and Methods of Fabricating Photomasks for Improving Damascene Wire Uniformity Without Reducing Performance
摘要 A method of improving damascene wire uniformity without reducing performance. The method includes simultaneously forming a multiplicity of damascene wires and a multiplicity metal dummy shapes in a dielectric layer of a wiring level of an integrated circuit chip, the metal dummy shapes dispersed between damascene wires of the multiplicity of damascene wires; and removing or modifying those metal dummy shapes of the multiplicity of metal dummy shapes within exclusion regions around selected damascene wires of the multiplicity of damascene wires. Also a method of fabricating a photomask and a photomask for use in improving damascene wire uniformity without reducing performance.
申请公布号 US2010261095(A1) 申请公布日期 2010.10.14
申请号 US20090622461 申请日期 2009.11.20
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 GRANT CASEY JON;HANKEY JUDE L.
分类号 G03F1/00;G03F7/20;G06F17/50;H01L21/3205 主分类号 G03F1/00
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