发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To use a DRAM in a larger range of temperature by narrowing a refreshment interval at high temperature. SOLUTION: A temperature measurement module TMP detects temperature, and outputs a signal according to detected temperature to a refresh counter RC and an access controller A_CONT. The refresh counter RC changes a refreshment interval according to the temperature by an output signal of the temperature measurement module TMP, and generates an address to perform refreshment in accordance with the refreshment interval of the DRAM. An access controller A_CONT generates the address for performing control of total operation of CHIP 2 and access to the DRAM. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010231883(A) 申请公布日期 2010.10.14
申请号 JP20100138091 申请日期 2010.06.17
申请人 RENESAS ELECTRONICS CORP 发明人 AYUKAWA KAZUSHIGE;MIURA SEISHI;SAITO YOSHIKAZU
分类号 G11C11/406;G11C5/00 主分类号 G11C11/406
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