| 摘要 |
A test head (3) has test electrodes (5) for electrical connection between a test unit (4) and interface board terminals (6). The state of electrical connection of the test electrodes (5) to the interface board terminals (6) is arbitrarily controlled using respective movable parts of the test electrodes (5), whereby the state of electrical connection between the test unit (4) and the interface board terminals (6) is changed.
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