发明名称 METHOD OF FABRICATING A SEMICONDUCTOR DEVICE HAVING A RECESSED CHANNEL MOS TRANSISTOR
摘要 <p>PURPOSE: A semiconductor device manufacturing method is provided to prevent a silicon residual, or silicon walls from remaining in the edge part of a gate trench which is contacted with an element isolation region. CONSTITUTION: A semiconductor device manufacturing method forms an element isolation region confining an activated region. A mask pattern has an opening crossing the activated region. The mask pattern(10) includes an oxide film having an insulation property. A back-up gate trench(15) is formed by etching an exposed activated region with the opening. Semiconductor walls remains in the side walls of the back-up gate trench, which face each other with being contacted with the element isolation region.</p>
申请公布号 KR20100111162(A) 申请公布日期 2010.10.14
申请号 KR20090029586 申请日期 2009.04.06
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, KEUM JOO;CHOI, BO WO;HWANG, IN SEAK
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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