发明名称 Method for determining deviations of predetermined position of markers at proximal mark nail end of implant for maintenance of crack in long bones of patient, involves utilizing determined deviation for correction of target guidance
摘要 The method involves providing a target mechanism (1) with parts of different form shapes laminarily connected with one another at a defined distance and stably connected with a carrier of invisible characteristic i.e. markers, at a proximal mark nail end at a defined distance and aligned on the characteristic in an undeformed implant (2). Deviation of expected position of the characteristic is determined from real position from an image of a radiograph from position of geometrical forms of the mechanism. The determined isometric deviation is utilized for correction of target guidance. An independent claim is also included for a device for determination of deviations of a predetermined position of an invisible characteristic by material deformation of implants.
申请公布号 DE102009017243(A1) 申请公布日期 2010.10.14
申请号 DE20091017243 申请日期 2009.04.09
申请人 MEDIZIN & SERVICE GMBH 发明人 BITTERLICH, NORMAN;WIGAND, GUNTER;BIEDERMANN, JENS;HINKEL, ALBRECHT
分类号 A61B19/00;A61B17/90 主分类号 A61B19/00
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