发明名称 PHASE CHANGE RAM DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <p>PURPOSE: A phase change RAM device and a manufacturing method thereof are provided to prevent remaining metal materials in patterning a top electrode from being diffused to a phase change layer. CONSTITUTION: A phase change RAM device includes a laminate pattern, a metal oxide layer, and a capping layer. A laminate pattern is comprised of a phase change layer(310), a top electrode(320), and an anti-reflection layer(330). The metal oxide layer is formed on the laminate pattern and prevents the diffusion of metal to the phase change layer. The capping layer is formed on the surface of the metal oxide layer.</p>
申请公布号 KR20100110630(A) 申请公布日期 2010.10.13
申请号 KR20090029064 申请日期 2009.04.03
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, HYUNG SUK;LEE, KEUM BUM;SEO, HYE JIN
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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