发明名称 FinFET memory cell having a floating gate and method therefor
摘要 A fin field effect transistor (FinFET) memory cell and method of formation has a substrate for providing mechanical support. A first dielectric layer overlies the substrate. A fin structure overlies the dielectric layer and has a first current electrode and a second current electrode separated by a channel. A floating gate has a vertical portion that is adjacent to and electrically insulated from a side of the channel and has a horizontal portion overlying the first dielectric layer and extending laterally away from the channel. The floating gate stores electrical charge. A second dielectric layer is adjacent the floating gate. A control gate adjacent the second dielectric layer and physically separated from the floating gate by the second dielectric layer. The “L-shape” of the floating gate enhances capacitive coupling ratio between the control gate and the floating gate.
申请公布号 US7811889(B2) 申请公布日期 2010.10.12
申请号 US20070835548 申请日期 2007.08.08
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 TRIVEDI VISHAL P.;MATHEW LEO
分类号 H01L21/336 主分类号 H01L21/336
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