发明名称 Built-in self test (BIST) architecture having distributed interpretation and generalized command protocol
摘要 Built-in self-test (BIST) architecture having distributed interpretation and generalized command protocol is disclosed. In an embodiment, a system is disclosed and includes a centralized built-in self-test (BIST) controller configured to store an algorithm to test a plurality of memory modules. The BIST controller stores the algorithm as a set of generalized commands that conform to a command protocol. The BIST controller is configured to send the set of generalized commands to a sequencer.
申请公布号 US7814380(B2) 申请公布日期 2010.10.12
申请号 US20080122702 申请日期 2008.05.18
申请人 QUALCOMM INCORPORATED 发明人 AVERBUJ ROBERTO FABIAN;HANSQUINE DAVID W.
分类号 G11C29/00;G11C29/16 主分类号 G11C29/00
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