发明名称 Manufacturing method of dual damascene structure
摘要 A manufacturing method of a dual damascene structure is provided. First, a first dielectric layer, a second dielectric layer, and a mask layer are formed. A first trench structure is formed in the mask layer. A via structure is formed in the mask layer, the second dielectric layer, and the first dielectric layer. A portion of the second dielectric layer is then removed, so as to transform the first trench structure into a second trench structure. Here, a bottom of the second trench structure exposes the first dielectric layer.
申请公布号 US7811930(B2) 申请公布日期 2010.10.12
申请号 US20090406938 申请日期 2009.03.18
申请人 UNITED MICROELECTRONICS CORP. 发明人 WANG CHIH-JUNG
分类号 H01L21/4763 主分类号 H01L21/4763
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