发明名称 MAIN BOARD APPLICABLE TO REAL TEST, MEMORY REAL TEST SYSTEM HAVING THE SAME
摘要 PURPOSE: A main board for mounting test, and a memory mounting test system having the same are provided to take less space and reduce the size by arranging the main board and memory module in parallel. CONSTITUTION: A main board(110a) comprises a first substrate(111) and a first socket(112). The first socket directly combines a first memory module with a first substrate in a direction parallel to the first substrate. The first socket is combined to the front of the first substrate and may be installed on the top portion of a substrate(111).
申请公布号 KR20100109662(A) 申请公布日期 2010.10.11
申请号 KR20090028027 申请日期 2009.04.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JUNG KUK;LEE, SEUNG HEE
分类号 G01R31/26;G11C29/00 主分类号 G01R31/26
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