发明名称 |
MAIN BOARD APPLICABLE TO REAL TEST, MEMORY REAL TEST SYSTEM HAVING THE SAME |
摘要 |
PURPOSE: A main board for mounting test, and a memory mounting test system having the same are provided to take less space and reduce the size by arranging the main board and memory module in parallel. CONSTITUTION: A main board(110a) comprises a first substrate(111) and a first socket(112). The first socket directly combines a first memory module with a first substrate in a direction parallel to the first substrate. The first socket is combined to the front of the first substrate and may be installed on the top portion of a substrate(111).
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申请公布号 |
KR20100109662(A) |
申请公布日期 |
2010.10.11 |
申请号 |
KR20090028027 |
申请日期 |
2009.04.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, JUNG KUK;LEE, SEUNG HEE |
分类号 |
G01R31/26;G11C29/00 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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