发明名称 METHOD OF MANUFACTURING A MEMORY DEVICE
摘要 <p>PURPOSE: A method for manufacturing a memory device is provided to secure a trapping film for electric charges with a uniform thickness by eliminating the exposed part of a pre-trapping film for electric charges through an isotropic etching process. CONSTITUTION: A tunnel insulating film(140) is formed on a substrate(100). A pre-trapping film for electric charges(154) is formed on the tunnel insulating film. An etching stop film is formed to expose a part of the pre-trapping film for the electric charges. The exposed part of the pre-trapping film for the electric charges is eliminated to form a trapping film for the electric charges with a uniform thickness. A dielectric film is formed on the trapping film for the electric charges. A gate is formed on the dielectric film.</p>
申请公布号 KR20100109786(A) 申请公布日期 2010.10.11
申请号 KR20090028219 申请日期 2009.04.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 FAYRUSHIN ALBERT
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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