发明名称 |
METHOD OF MANUFACTURING A MEMORY DEVICE |
摘要 |
<p>PURPOSE: A method for manufacturing a memory device is provided to secure a trapping film for electric charges with a uniform thickness by eliminating the exposed part of a pre-trapping film for electric charges through an isotropic etching process. CONSTITUTION: A tunnel insulating film(140) is formed on a substrate(100). A pre-trapping film for electric charges(154) is formed on the tunnel insulating film. An etching stop film is formed to expose a part of the pre-trapping film for the electric charges. The exposed part of the pre-trapping film for the electric charges is eliminated to form a trapping film for the electric charges with a uniform thickness. A dielectric film is formed on the trapping film for the electric charges. A gate is formed on the dielectric film.</p> |
申请公布号 |
KR20100109786(A) |
申请公布日期 |
2010.10.11 |
申请号 |
KR20090028219 |
申请日期 |
2009.04.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
FAYRUSHIN ALBERT |
分类号 |
H01L21/8247;H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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