发明名称 DETERGENT FOR LITHOGRAPHY AND METHOD FOR FORMING RESIST PATTERN USING THE SAME
摘要 <p>PURPOSE: A cleaning solution for a lithography, and a formation method of a resist pattern using thereof are provided to effectively control the generation of a CD shift without interfering the prevention of a pattern collapse. CONSTITUTION: A cleaning solution for a lithography contains an anionic surfactant, an amine compound, and water. A formation method of a resist pattern comprises the following steps: forming a resist film on a substrate; selectively exposing the resist film by inserting a mask pattern; heating the resist film; alkali developing the resist film to form the resist pattern; and contacting the resist pattern with the cleaning solution.</p>
申请公布号 KR20100109428(A) 申请公布日期 2010.10.08
申请号 KR20100027175 申请日期 2010.03.26
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 KUMAGAI TOMOYA;MASUJIMA MASAHIRO;KOSHIYAMA JUN
分类号 C11D1/02;G03F7/42;H01L21/027 主分类号 C11D1/02
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