发明名称 |
DETERGENT FOR LITHOGRAPHY AND METHOD FOR FORMING RESIST PATTERN USING THE SAME |
摘要 |
<p>PURPOSE: A cleaning solution for a lithography, and a formation method of a resist pattern using thereof are provided to effectively control the generation of a CD shift without interfering the prevention of a pattern collapse. CONSTITUTION: A cleaning solution for a lithography contains an anionic surfactant, an amine compound, and water. A formation method of a resist pattern comprises the following steps: forming a resist film on a substrate; selectively exposing the resist film by inserting a mask pattern; heating the resist film; alkali developing the resist film to form the resist pattern; and contacting the resist pattern with the cleaning solution.</p> |
申请公布号 |
KR20100109428(A) |
申请公布日期 |
2010.10.08 |
申请号 |
KR20100027175 |
申请日期 |
2010.03.26 |
申请人 |
TOKYO OHKA KOGYO CO., LTD. |
发明人 |
KUMAGAI TOMOYA;MASUJIMA MASAHIRO;KOSHIYAMA JUN |
分类号 |
C11D1/02;G03F7/42;H01L21/027 |
主分类号 |
C11D1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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