发明名称 METHOD FOR INSPECTING PHOTOMASK BLANK OR INTERMEDIATE THEREOF, METHOD FOR DETERMINING DOSAGE OF HIGH-ENERGY RADIATION, AND METHOD FOR MANUFACTURING PHOTOMASK BLANK
摘要 <p>PURPOSE: A photomask blank or manufacturing assembly inspection method, high energy beam irradiation energy determination method, and a photomask blank manufacturing method are provided to accurately estimate the stress of the photomask blank or a phase shift film of photomask blank manufacturing intermediate work. CONSTITUTION: After substrate forming adjustment is processed, the surface shape of a photomask blank(102) or a work in manufacturing process is measured. The surface shape of the processed substrate with the shift film removed is measured. The invention measures the variation of bending states of before and after the phase shift film is removed.</p>
申请公布号 KR20100109469(A) 申请公布日期 2010.10.08
申请号 KR20100028257 申请日期 2010.03.30
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 INAZUKI YUKIO;KANEKO HIDEO;YOSHIKAWA HIROKI
分类号 H01L21/027;G03F1/32;G03F1/50;G03F1/60;G03F1/68;H01L21/66 主分类号 H01L21/027
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