发明名称 CONFORMAL PHOTO-SENSITIVE LAYER AND PROCESS
摘要 The present disclosure provides a method for etching a substrate. The method includes forming a patterned photo-sensitive layer on the substrate; applying an etching chemical fluid to the substrate, wherein the patterned photo-sensitive layer includes an adhesion promoter and/or hydrophobic additive; removing the etching chemical fluid; and removing the resist pattern.
申请公布号 US2010255427(A1) 申请公布日期 2010.10.07
申请号 US20100751250 申请日期 2010.03.31
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 WANG CHIEN-WEI;HUANG VICTOR;CHANG CHING-YU
分类号 G03F7/20 主分类号 G03F7/20
代理机构 代理人
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