发明名称 MEASURING DEVICE, FREQUENCY-RATIO MEASURING CIRCUIT, MEASURING METHOD AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To automatically change the measurement accuracy of a frequency ratio, according to the fluctuation state of the frequency ratio without having to change the measurement cycle from the outside. SOLUTION: A measuring device measures the frequency ratio between a comparison clock signal and a reference clock signal which are independent of each other. The measuring device compares the difference between the frequency ratio measured with a specific timing and the frequency ratio measured at a timing, after a predetermined measurement cycle from the specific timing, and a reference threshold, set in advance. The measuring device controls the measurement cycle of the frequency ratio, based on the comparison result. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010223780(A) 申请公布日期 2010.10.07
申请号 JP20090071791 申请日期 2009.03.24
申请人 NEC CORP 发明人 HATA HIDEO
分类号 G01R23/10 主分类号 G01R23/10
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