| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit which allows a failure bit to be easily inserted to the memory, and a method for verifying a function of a memory. SOLUTION: A BIST circuit 1 includes a BIST control circuit 11, a data creation circuit 12, a timing register 13, a bits inversion circuit 14, an address creation circuit 15, a control signal creation circuit 16, and a result analysis circuit 17. The bits inversion circuit 14 is provided in the BIST circuit 1, and a part of bits in write-in data is inverted based on a failure insertion indicating signal. Therefore, a virtual failure bit can be inserted to the memory 2 accordingly even when practically no failure bit exists in the memory 2. Thus, the function verification for quality judge or relief analysis can be easily carried out. COPYRIGHT: (C)2011,JPO&INPIT
|
