发明名称 PLASMA PROCESSING APPARATUS AND METHOD FOR ADJUSTING PLASMA DENSITY DISTRIBUTION
摘要 In the plasma processing apparatus 1, microwaves supplied from a coaxial waveguide 30 are introduced into a processing container 2 via a wavelength-shortening plate 25, a process gas is plasmatized in the processing container 2, and a substrate W is processed using the plasma. In the plasma processing apparatus 1, a dielectric member 45 is disposed at a connecting area between the coaxial waveguide 30 and the wavelength-shortening plate 25. Inside an outer conductor 32 of the coaxial waveguide 30, the dielectric member 45 is disposed to surround a part of a circumference of an inner conductor 31 of the coaxial waveguide 30, and is disposed at any position around the circumference of the inner conductor 31.
申请公布号 US2010252412(A1) 申请公布日期 2010.10.07
申请号 US20080681434 申请日期 2008.10.02
申请人 TOKYO ELECTRON LIMITED 发明人 TIAN CAIZHONG;ISHIBASHI KIYOTAKA;NOZAWA TOSHIHISA
分类号 H05H1/46 主分类号 H05H1/46
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