ETCHING PROCESS CONTROL

摘要

The invention relates to a method for detecting an oxide layer on a metal strip moving in a continuous-production plant that comprises monitoring the moving strip using a contactless detection system based on the measurement of a thermal radiation emitted by said strip, characterised in that it comprises measuring the exposed temperature of the strip in a plurality of areas, i.e. the measure is carried out by deliberately omitting the application of an emissivity correction, and in that an oxide-covered layer is identified by an apparent temperature value that is substantially higher than that of one or more other oxide-free areas.