PURPOSE: A contact pin with superior elastic force is provided to electrically connect the terminal of a semiconductor chip and the terminal of an external test circuit. CONSTITUTION: A base part(10) is in connection with the terminal of an external test circuit. The base part is fixed to a socket(40). A pair of bow parts is upwardly expanded from the base part and be widen to left and right directions. A center pin part is arranged between the bow parts. Contact parts(30) are spaced apart from the end of the bow parts and are in connection with the terminal of the external test circuit.
