发明名称 PLASMA DIAGNOSTIC APPARATUS
摘要 PURPOSE: A plasma diagnostic apparatus is provided to calculate electron density and temperature from the current size of a vibration frequency in a bottom electrode by estimating the selection ratio from a DC component of a measured voltage at a detector. CONSTITUTION: A chamber unit(10) comprises an upper electrode(3) and a bottom electrode(6). A plasma generating unit(20) generates plasma inside the chamber unit. A bias supply unit(30) applies a bias to the bottom electrode. A signal supply unit(40) is directly connected to the bottom electrode. An analysis unit(50) analyzes the harmonic components of a current. A capacitor(60) blocks the DC component of a current which is generated in the bottom electrode. A DC detector measures the DC component the current which is generated in the bottom electrode.
申请公布号 KR20100106088(A) 申请公布日期 2010.10.01
申请号 KR20090024537 申请日期 2009.03.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SON, GIL SU;JEON, SANG JEAN;KIM, SU HONG
分类号 H01L21/3065;H01L21/66 主分类号 H01L21/3065
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