发明名称 APPARATUS FOR THERMALLY TREATING SEMICONDUCTOR SUBSTRATES
摘要 <p>An apparatus for thermally treating semiconductor substrates has a processing space which is defined by first walls substantially parallel to the semiconductor substrate and a second side wall connected to the first walls; a substrate holding device disposed in the processing space which defines a substrate retaining region for a semiconductor substrate in the processing space; and heating elements which are disposed in the processing space between at least one of the first walls and the substrate retaining region. The thermal gradient between the edge of the semiconductor substrate and the center of the semiconductor substrate can be effectively compensated by providing a shutter between the substrate retaining region and the heating elements which limits the radiation emitted in the processing space by the heating elements in the direction of the substrate retaining region.</p>
申请公布号 KR20100106322(A) 申请公布日期 2010.10.01
申请号 KR20107011803 申请日期 2008.11.06
申请人 MATTSON TECHNOLOGY, INC. 发明人 FALTER MANFRED
分类号 H01L21/324 主分类号 H01L21/324
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