发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device for easily and accurately detect whether a rewiring resistance value of a constant voltage circuit is within a desired range by a tester. SOLUTION: The semiconductor device includes a semiconductor chip 10 having a first pad Cout1 for output and a second pad Cout2 for external terminal voltage measurement, and a package 20 having an external terminal Out. The first pad and second pad of the semiconductor chip 10 and the external terminal Out of the package are connected with rewiring 21, 22, and a voltage of the external terminal Out is measured through the first pad Cout1 and second pad Cout2. The first pad, second pad, and a test pad Ctst are connected via switching means SW2, SW4. The voltage of the external terminal Out can be measured by the tester 3 arranged in the external of the semiconductor device. Thereby, the rewiring resistance value between the first pad and second pad can be easily detected, and whether the resistance value is within the desired range or not can be accurately detected. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010219100(A) 申请公布日期 2010.09.30
申请号 JP20090061003 申请日期 2009.03.13
申请人 RICOH CO LTD 发明人 NAGATA TOSHIHISA
分类号 H01L21/822;G01R31/28;H01L23/12;H01L27/04 主分类号 H01L21/822
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