发明名称 LED TESTING APPARATUS AND TESTING METHOD THEREOF
摘要 There is provided an LED testing apparatus. An LED testing apparatus according to an aspect of the invention may include: a first lighting unit generating first light and irradiating the first light onto an LED having an encapsulant including a fluorescent material excited by the first light to emit light having a longer wavelength than the first light; a second lighting unit generating second light having a longer wavelength than the first light to irradiate the second light onto the LED; an image acquisition unit receiving the light emitted from the fluorescent material and the second light reflected off the LED to acquire images of the LED; and an LED state determination unit determining whether the LED is acceptable or defective using the images of the LED acquired by the image acquisition unit. There is further provided an LED testing method using the LED testing apparatus.
申请公布号 US2010246936(A1) 申请公布日期 2010.09.30
申请号 US20090630448 申请日期 2009.12.03
申请人 JI WON SOO;LEE WOOK HEE;SONG HO YOUNG;CHO CHONG WOOK;KIM SUNG JAE;YUN YOUNG SU;KIM HONG MIN 发明人 JI WON SOO;LEE WOOK HEE;SONG HO YOUNG;CHO CHONG WOOK;KIM SUNG JAE;YUN YOUNG SU;KIM HONG MIN
分类号 G06K9/00 主分类号 G06K9/00
代理机构 代理人
主权项
地址